LVC08A DATASHEET PDF

LVC08A Logic Gates are available at Mouser Electronics. Mouser offers inventory, pricing, & datasheets for LVC08A Logic Gates. LVC08A Quadruple 2-input Positive-and Gates. EPIC TM (Enhanced- Performance Implanted CMOS) Submicron Process ESD Protection Exceeds V Per. The ‘LVC08A devices perform the Boolean function Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

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The value of VCC is provided in the recommended operating conditions table. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability.

The ovc08a thermal impedance is calculated in accordance with JESD Products conform to specifications per the terms of Texas Instruments standard warranty. S1 Open GND 1k?

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Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. TI assumes no liability for applications assistance or customer product design. On all other products, production processing does lvd08a necessarily include testing of all parameters. The outputs are measured one at a time with one transition per measurement.

All input pulses are supplied by generators datwsheet the following characteristics: Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty.

S1 Open GND ? The input negative-voltage and output voltage ratings may be exceeded if the input and output current ratings are observed. B or Y A B in positive function Y logic. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used.

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Texas Instruments – datasheet pdf

Supply voltage range, VCC. Production processing does not necessarily include testing of all parameters. Waveform 1 is dataseet an output with internal conditions such that the output is low except when disabled by the output control. CL includes probe and jig capacitance. This feature allows the use of these devices as translators in a mixed 3. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements.

Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.