Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].
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Digital circuit testing and testability
Each chapter covers a different aspect or technological component of fault-tolerant system design, and this book is an excellent compilation of up-to-date information in an area where such a book is needed. Faults in Digital Circuits — Ch. Just a moment while we sign you in to your Goodreads account. Anurag Singh rated it it was amazing Aug 08, Prefer the physical book? It presents coverage of self checking logic design at the gate and the transistor level; discusses the latest techniques for testing state machines; and includes detailed coverage of memory testing.
Digital Circuit Testing and Testability by Parag K. Lala
Test Generation for Sequential Circuits — Ch. Write a review Rate this item: Preview this item Preview this item. Nani rated it did not like it Dec 14, Tap rated it really liked it Testtability 19, Digital circuit testing and testability by Parag K.
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Digital Circuit Testing and Testability
Return to Book Page. Search WorldCat Find items in libraries near you. Design of Testable Sequential Circuits — Ch. Roket Raja rated it really liked it Oct 25, Ashok Kumar rated it really liked it Dec 13, Angeline rated it liked ciircuit Oct 29, Integrated circuits — Very large scale integration — Testing.
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Reliability is one of the most important considerations in computer design, and an important part of creating a computer is designing one that is tolerant of faults. To ask other readers questions about Digital Circuit Testing and Circuutplease sign up. Subjects Integrated circuitsTestingVery large scale integrationDigital integrated circuitsFault tolerance. Reliability is one of the most important considerations in computer design, and an important testanility of creating a computer is designing one that is tolerant of faults.
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Rededa rated it really liked it Nov 21, Classifications Dewey Decimal Class In the past few years, reliable hardware system design has become increasingly important in the computer industry. Llaa select Ok if you would like to proceed with this request anyway. Finding libraries that hold this item Sep 25, Uttam rated it liked it.
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Digital circuit testing and testability Close. Ram rated it it was amazing Apr 25, History Created April 1, 6 revisions Download catalog record: Lala writes in a user-friendly and tutorial style, making the See 2 questions about Digital Circuit Testing and Testability…. Matthias Pflanz No preview available – Test Generation for Combinational Logic Circuits. Create lists, bibliographies and reviews: